Are we able to use the thermal model to test SiC and GaN in RT-BOX?

Question

I want to test the SiC and GaN and other model in plecs ,I know we can do that offline ,but does it support real time testing?

Answer 1

Currently, using device thermal models in real-time on the RT Box is not supported.

Comments

Thank U so much ~I read a thesis modling the GaN via plecs recently and it was quite thought-provoking.