Are we able to use the thermal model to test SiC and GaN in RT-BOX?

I want to test the SiC and GaN and other model in plecs ,I know we can do that offline ,but does it support real time testing?

Currently, using device thermal models in real-time on the RT Box is not supported.

Thank U so much ~I read a thesis modling the GaN via plecs recently and it was quite thought-provoking.