I’ve entered the correct directory in the “C2Prog GDB server directory” field, but whenever I try to connect using a custom board, this error always pops up.
Could you provide a bit more information? It would help narrow down the issue.
What version of PLECS are you using?
What version of the Target Support Package (TSP) are you using?
What operating system are you running?
Which MCU are you targeting?
If possible, could you also provide a minimal example model that reproduces the issue? A simplified model often makes it much easier to identify the root cause.
I’m using PLECS Standalone Student 4.9.4 (64-bit) on Windows 11.
I’m targeting a TI C2000 TMS320F28377S.
At the moment, I’m just testing a minimal example to make an LED blink.
Great. If you could provide that model (assuming it is the one that reproduces the issue), along with the target configuration file you are using, that would be very helpful in understanding and reproducing the problem.
Additionally, I would recommend upgrading to the latest versions of both PLECS and the TI Target Support Package (TSP), as they include general improvements, bug fixes, and performance enhancements.
Thanks for sending the model. What version of the TI TSP are you using?
To help rule out any communication or setup issues, could you try connecting to the MCU on your custom board using the CCXML file (for example via Code Composer Studio) and confirm that the connection works? The log should show something like the following:
-----[Perform the Integrity scan-test on the JTAG DR]------------------------
This test will use blocks of 64 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 0
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 0
All of the values were scanned correctly.
The JTAG DR Integrity scan-test has succeeded.
[End: Texas Instruments XDS110 USB Debug Probe]
I am using the TI C2000 ‘Target Support Package’, version 1.10.1, and when I run a connection test with CCS, I get the following (using the TI XDS100v2 debug probe):
-----[Perform the Integrity scan-test on the JTAG DR]------------------------
This test will use blocks of 64 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 0
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 0
All of the values were scanned correctly.
We do not provide support for older versions of the Target Support Package (TSP), as they may contain bugs that have already been addressed in more recent releases.
Additionally, I had a quick discussion with the developers, and they mentioned that older TSP versions do not support JTAG communication with custom boards. Instead, you will need to use serial communication when working with those versions.